There are many diverse applications where the use of Particle Characterization measurement equipment is instrumental in the analytical control of processes for refining and manufacturing as well as scientific research. Follow the links on the right hand side of this page to find more information about specific applications or industries where particulate control is vital to successful organizations.
Microtrac offers a variety of innovative solutions to address your Particle Characterization needs:
Today’s particle size measurement needs encompass a large range. Whereas 25 –30 years ago measurements were typically in sieve sizes (22 – 1000 microns), advancing technology in materials science, ceramics, nanotechnology and biotechnology have stretched demands for measurements to a range as low as 1 nanometer and as high as many thousands of microns.
There are a number of types of optical devices for particle size analysis in use and available commercially. They include diffraction, dynamic light scattering, and imaging, and electron microscopy techniques. Electron microscopes have been in use, primarily in research institutes, since the 1960s. Diffraction technology has been available in the US since the Microtrac product line’s introduction by Leeds and Northup in 1974. Dynamic Light Scattering (DLS) has been available since approximately 1972. Imaging measurements using CCD cameras is a relatively new technique that was just introduced in the past few years. Each technology’s strength lies in a different particulate size range.
Electron microscopy, with an approximate measurement range of .0001 to 1000 microns, is primarily of interest as a research tool due to the high investment cost of this instrumentation. Scanning Electron Microscopes can provide significant cost savings over Transmission Electron Microscopes, but also sacrifice the nanometer range capabilities. Both technologies offer information on the smallest size present, agglomeration, topography, elemental analysis and aspect ratio.
Diffraction is best used in the particle size range 0.2 to 3,000 microns. Configuration issues (optical focal length) as well as the practicality of suspending the particles in a fluid impose the upper size limits on these instruments. Greater versatility can be achieved from those systems that are also capable of measuring particulates in a dry state. Some manufacturers extend their instrument’s low range capabilities (.04 microns) through advances using multiple light sources, detectors and complex mathematical extrapolation formula. Microtrac's Bluewave (blue laser) system has succeeded in stretching the low end of this technology's measurement range to its theoretical minimum of .01 microns with an accuracy and repeatability unmatched by the competition.
Dynamic light scattering finds its primary use in particle size ranges from .001 to 1.0 microns (nanometer range) since most particles larger than 1 micron will settle and thus be removed from the sensing area before a measurement is completed. However the capability to measure to 1 nanometer provides affordable opportunities to measure a vast array of new materials born from specialized elemental atomization, biosynthesis and developing pharmaceutical applications.
Imaging techniques using CCD cameras are useful for particle sizes in the range 2 to many thousand microns. In some cases, these devices can provide aspect ratios as well as particle size and other particle size related computations.
Optical technology has advanced to make measurements in any particle size range quite easy, affordable and available to most companies who deal with material technologies. A careful evaluation of the end-user’s application is essential in selecting the proper instrument to meet each company’s needs.