Semtrac - Desktop Scanning Electron Microscope
The Scanning Electron Microscope (SEM) is used for observing the surface structure of a sample. The column is made up of an electron gun that generates a stream of electrons. The stream passes through apertures and an electronic lens system that controls the flow of electrons. The electron stream then passes through scan coils that raster the beam over the sample. Secondary electrons are emitted from the sample and are then collected by the secondary electron detector. The secondary electron signal is digitally captured, processed and ported through a USB connector to a PC for viewing. The PC software also controls the column settings. The column settings are the magnification, high voltage, condenser lens, vacuum and other microscope setting. The microscope was designed with an intuitive easy to use software interface. Automatic and manual operations are completely software driven.
♦ Compact Design
o Desktop installation
o No cooling water required
♦ High Resolution
o High accelerating voltage
o High magnification
o Deep focus depth
♦ Element Analysis Function available (EDX OPTION)
o Solid element analysis results obtained
with high accelerating voltage (max 30kV)
♦ Easy Operation
o Auto start
o Auto focus
o Auto brightness/contrast
Total Solutions in Particle Characterization