Particle Size and Zeta Potential Analyzers ideal for the chemical community will be shown at the ACS Dallas Meeting and Expo.
Microtrac, the global pioneer of particle characterization solutions is proud to be exhibiting at the American Chemical Society’s Spring National Meeting. The meeting is being held in Dallas, Texas, and is the ideal platform for the chemical community to present, publish, discuss, and showcase the latest discoveries and technologies. The meeting is being held at the Dallas Convention Center and runs from March 16-20.
Since the 1970’s, Microtrac has been supplying the chemical community with particle size and zeta potential analyzers that enable users to complete fast, and accurate measurements of their material. The following analyzers will be displayed from their industry preferred product line at booth 1628.
Bluewave SI – Have you seen your agglomerates? Now you can by harnessing the power of simultaneous particle size and shape measurements with the Bluewave SI. The Bluewave is a laser diffraction particle size analyzer that can measure particles ranging in size from 0.01 to 2000 microns. The Bluewave is the first particle analyzer to use blue lasers, which provides users with unsurpassed resolution. The SI is a dynamic Image Analyzer that has the ability to measure 24 morphological parameters of your particles ranging in size from 5 to 1500 microns.
Nanotrac Wave – The Nanotrac Wave is Dynamic Light Scattering particle analyzer that can measure size, zeta potential, and molecular weight in one self contained unit. The Nanotrac Wave can measure particles ranging in size from 0.8 to 6500 nanometers. What sets the Nanotrac Wave apart from other DLS analyzers is the ability to accurately measure multimode samples of particles under 20 nanometers with great precision because of the patented Controlled Reference Method. Another added advantage of the Nanotrac Wave is the ability to measure particles with a wide concentration range (0.01 to 40%).
Nanotrac Flex – The Nanotrac Flex is ideal for users who want to measure the size of nanoparticles in-situ. The NANO-flex incorporates the patented Controlled Reference Method, which provides users with unsurpassed resolution and accuracy when measuring particles under 20 nanometers. Another added advantage of the NANO-flex is the ability to measure particles with a wide concentration range (0.01 to 40%). The NANO-flex also can be paired with the Stabino for Zeta Potential analysis capability.
Can’t make it to ACS Dallas and want to learn more about Microtrac’s solutions? No problem, please click here to contact us to speak to a technical specialist or arrange to send your samples for complimentary analysis.
We look forward to seeing you in Dallas!