Posts Tagged ‘particle characterization’

WEBINAR SHOWCASES FASTER AND MORE ACCURATE PROPPANT MEASUREMENT TECHNIQUE

Posted on: November 4th, 2015 by Microtrac

WEBINAR SHOWCASES FASTER AND MORE ACCURATE PROPPANT MEASUREMENT TECHNIQUE

Proppants, a key material used in “fracking” to keep shale fissures from collapsing, as well as, facilitating gas flow to the surface must have a uniform appearance to ensure optimal drilling efficiency. Whether the proppants are sand, ceramic, or resin coated, they must have a narrow size distribution, spherical shape, and smooth convex surface. Any deviation from these ideal properties will decrease their strength, reduce packing density, and lower conductivity, which will have an adverse effect on the output of the drilling operation.

Current methods for measuring these properties include sieve analysis and visual inspections. Although widely accepted, these methods are prone to operator errors and data inconsistencies. Sieves also only measure a small amount of material over a long period of time, resulting in lengthy delays before poor quality materials are identified.

By detecting poor quality materials faster and more accurately, both proppant manufacturers and their customers can experience significant financial benefits, as well as improved productivity.

Microtrac, the global pioneer of particle characterization solutions will be presenting a free technical webinar on Thursday, November 5 at 11am EST that demonstrates how to ensure optimal material properties of proppants by using 3D Dynamic Image Analysis.

This webinar will demonstrate how to accurately measure sphericity and roundness of multiple size fractions in one analysis, providing a significant time savings compared to conventional methods. By automating your analysis, users can enable immediate corrective action when product deviations occur, ensuring tight size distributions for optimal product quality over a larger sample set. A throughout explanation will be given on how 3D Image Analysis will improve data consistency by eliminating operator error and visual estimations. Most importantly, the presentation will discuss how to increase your bottom line by reducing wasted material and write-offs.

For parties who are interest in attending the webinar, please click the link below. Ample time will be available after the presentation for Q&A with technical experts from Microtrac.

https://attendee.gotowebinar.com/register/882240802941867778

To learn more about the benefits of 3D Dynamic Image Analysis, click the link below to download the brochure.

Image Analysis Product Family Brochure

Improving Cosmetics, One Particle At A Time – Society Of Cosmetic Chemists California Suppliers’ Day

Posted on: October 12th, 2015 by Microtrac

Improving Cosmetics, One Particle At A Time – Society Of Cosmetic Chemists California Suppliers’ Day

A lot of chemistry goes into the development and production of your favorite cosmetic. A small, yet vital measurement during the process is particle size.

Having a tight particle size distribution is important to ensure the product can be applied evenly, hold up long enough to make it through your event without needing to “touch up,” wash off at the end of the night, and radiate the perfect hue.

Since 1974, Microtrac has been supplying particle characterization solutions to the global material science community. To continually increase our reach, we are always searching for events to showcase our instrumentation.

We are proud to be participating in the 2015 edition of the California Chapter of the Society of Cosmetic Chemists Suppliers’ Day. This two-day event is being held in Long Beach, CA from October 14-15 at the Long Beach Convention Center. The biennial meeting will bring together cosmetic and toiletry chemists from the West Coast to learn about the latest innovations in technology and raw materials.

Located at booth 168, Microtrac will be showcasing the following solutions.

For nanoparticle size analysis – The Nanotrac Wave II, which measures size and zeta potential of particles ranging from sub nanometer to 6.5 microns. Delivering superior accuracy and sensitivity compliments of our proprietary probe technology; the Wave II is ideal for single or multi-mode size distributions. What sets Microtrac’s DLS apart from the rest is our sample introduction options. Rather than force you into one sample cell, we give you options that meet your specific application needs. Our DLS systems feature a removable sample cell, disposable cuvette, or external probe for in-situ analysis.

Mixture of nano and micron sized particles – Looking for a flexible instrument that covers a size range from sub-micron to several millimeter particles? The Microtrac S3500 offers fast, precise, and repeatable size measurements via laser diffraction from 20 nanometers to 2800 microns. Featuring a tri-laser design, reverse fourier optical system, and advanced algorithms the S3500 provides users with superior analysis capability for wet or dry materials. Users can streamline their measurements by integrating wet or dry sample delivery devices, which ensure consistent results.

Coarse materials – Want to measure larger materials before their size is reduced? Ask about our patented 3D measurement for materials larger than 15 microns. We offer a solution that measures length, width, and thickness in one fast analysis, which enables users to quickly identify product deviations and take immediate corrective action.

Can’t make it to Long Beach because your boss won’t approve your travel request? No problem! You can learn about our particle characterization solutions without leaving your office. Sign up for the following webinars:

10/22 11am EST – “Accurate Particle Sizing Of Fragile And Difficult To Disperse Dry Powders”

Register here

11/5 11am EST – “Ensure Optimal Material Properties With 3D Dynamic Image Analysis”

Register here

Speak with a Microtrac Technical Specialist.

Particle sizers on display for the ceramic community – ICCACC’15

Posted on: January 30th, 2015 by Microtrac

Particle sizers on display for the ceramic community – ICCACC’15

Sun, sand, and all things ceramics.  What more could you ask for from the 39th International Conference and Exposition on Advanced Ceramics and Composites, commonly referred to as the ICCACC?  The 2015 version is being held at the Hilton Daytona Beach Resort and Ocean Center, in beautiful Daytona Beach, Florida from 1/25/15 to 1/30/15.  The ICCACC is the premier event in the ceramic industry that is attended by material scientist and technology providers from around the world.

Typically, networking with peers and swapping stories about the latest industry trends is at the top of your priority list. But perhaps part of your agenda is to evaluate capital equipment for purchase in 2015.  If a particle analysis solution is on your radar, then you need to stop by booth 325 to check out the only 3D particle size and shape analyzer on the market.

Microtrac, the global pioneer of particle characterization will be displaying the PartAn 3D, a particle size and shape analyzer that measures dry materials ranging in size from 15 microns to 35 millimeters.  The technology driving the PartAn 3D is Dynamic Image Analysis, but what makes the PartAn 3D unique is it’s ability to measure all three dimensions of a particle; length, width, and thickness, which provides the user with a superior measurement compared to 2D image analysis.

3D-Image-Analysis

Pictured above is an illustration of how the PartAn 3D measures particles. By capturing multiple orientations of the same particle, the PartAn 3D provides a level of detail unlike any other analyzer on the market.

In addition to the 3D capability, the PartAn 3D can measure 32 morphological parameters that include size, shape, surface roughness, flakiness, sphericity, aspect ratio, and transparency (to name a few).

Don’t be overwhelmed by all of those parameters.  Most applications will only use several to analyze the material based upon their quality control protocol, and besides the software allows you to display the parameters you are interested in reporting.

The software features three very powerful data reporting options including filter functions, view particles, and scatter grams.  When used for quality control purposes, users can see process variations in real-time, enabling quick and decisive actions to rectify the problem.

ViewParticles

Pictured above is the view particles screen. This screen shots shows an SOP set up that sorts particles in three categories; top right – raw material, middle – good particle, and bottom – bad particle (agglomerated).

Interested in using Dynamic Image Analysis to control your process in an online capacity?  Microtrac offers the PartAn PRO series, a complete suite of online analyzers.  For more information on the product line, click here. 

If Dynamic Image Analysis isn’t for you, don’t worry.  Microtrac also offers Laser Diffraction and Dynamic Light Scattering instrumentation to meet your particle characterization needs.

Not able to make it to Daytona this week?  No problem, click here to contact a Microtrac Sales Specialist.

MRS Fall 2014 – meeting of the material science minds

Posted on: December 3rd, 2014 by Microtrac

MRS Fall 2014 is an annual event where the best and the brightest minds of the material science community converge on Boston’s Hynes Convention Center for an opportunity to network and share best practices with peers from around the world.  This year the event runs from November 30 to December 5.

Microtrac, the global pioneer of particle characterization solutions has been providing the material science community with innovative analyzers for over 40 years.   Microtrac looks forward to the MRS Fall Meeting every year, and will be displaying several pieces of instrumentation from our product line at booth 828 at this year’s event.

If you are interested in measuring particle size and shape of large particles, then you need to check out the PartAn3D.  The PartAn3D is the only analyzer on the market with the ability to measure particles in 3D, while measuring additional morphology parameters such as aspect ratio, ellipse ratio, convexity, concavity, transparency, density, and surface roughness (to name a few).

Perhaps you might be interested in an accurate method to measure multi-modal nanoparticle dispersions.  If so, then you need to check out the Nanotrac Wave.  The Nanotrac Wave can measure particle size, zeta potential, and molecular weight in one self contained chasis.  The Nanotrac Wave utilizes and enhancement to Photon Correlation Spectroscopy, called Reference Beating, which increases the optical signal to the photo-detector anywhere from 100 to 1,000,000 times compared to traditional DLS.  This approach provides the user with unparalleled accuracy, repeatability, and precision.

Can’t make it to Boston, but would like to see Microtrac’s instrumentation?  No problem, click the link below to arrange a complimentary sample submission or arrange an onsite demo.

 Contact us today!  

We look forward to seeing you at Boston!

PartAn SI – Five years of delivering integrated laser diffraction and dynamic image analysis solutions.

Posted on: November 4th, 2014 by Microtrac

PartAn SI – Five years of delivering integrated laser diffraction and dynamic image analysis solutions.

Ever since the release of the 7991 in 1974, Microtrac, the global pioneer of particle characterization solutions has continually advanced laser diffraction analysis technology.  A laser diffraction user can monitor the quality of their material by measuring particle size distributions with the instrument, however in order to inspect additional morphology parameters, they would need to utilize alternative instrumentation.

In 2009, Microtrac met the unmet customer need of being able to quickly and accurately measure particle morphology by integrating the PartAn SI, a dynamic image analyzer with a laser diffraction instrument.  This harmonized solution allows the user to drastically improve their understanding of their material and enables them to quickly identify out of spec product.

The PartAn SI can measure >25 morphological parameters of wet suspensions including length, width, volume, perimeter, sphericity, circularity, aspect ratio, convexity, solidity, concavity, and transparency (to name a few).  The PartAn SI’s measurement range includes any particles from 5 to 1500 microns, while the laser diffraction analyzers can measure size from 0.01 to 2800 microns.

To learn about the powerful advantages of integrated laser diffraction and dynamic image analysis check out this on demand presentation below.

If you would like to submit samples for complimentary please contact us today! 

 

Powder and bulk solid professionals trust Microtrac for their Laser Diffraction based particle-sizing needs

Posted on: May 6th, 2014 by Microtrac 1 Comment

Powder and bulk solid professionals trust Microtrac for their Laser Diffraction based particle-sizing needs.

Microtrac, the global pioneer of particle characterization solutions will be exhibiting laser diffraction based particle size analyzers at the 2014 Powder & Bulk Solids Conference.  The conference will be held in Rosemont, IL at the Donald E. Stephens Convention Center and will run from May 6-8.

The International Powder & Bulk Solids conference is the premier event for dry processing and bulk material professionals who are looking to learn about the latest technological innovations and best practices.

Since our first patent in the early 1970’s, Microtrac has been at the forefront of providing precise, reliable, and repeatable laser diffraction particle sizing technology to the powder community.  With the expertise, knowledge, and enhancements we have developed over the years, it is no surprise that Microtrac is the brand that quality control and research and development departments trust.

Located at booth 2731, Microtrac will be displaying the following laser diffraction particle sizing instruments.

S3500 – The S3500 is our most popular particle size analyzer.  With our rugged design, the S3500 can measure particles ranging in size from 0.02 to 2800 microns.  Enhanced with a modified mie theory calculation, the S3500 can accurately measure non-spherical particles with superior resolution.  For automated sample delivery, consider the Turbotrac dry powder feeder, which delivers a clean, evenly dispersed sample with a touch of a button.

New to Microtrac! Ask us about our dynamic image analysis product line.  For the first time you can now see your particles in 3D!

Looking forward to seeing you in Rosemont!  Can’t make it?  Click here to contact us to learn more about our particle sizing solutions.

Contact us

Particle Size, Particle Shape, and Zeta Potential Analyzers showcased at the 2014 Pittcon exhibition.

Posted on: March 3rd, 2014 by Microtrac

Particle Size, Particle Shape, and Zeta Potential Analyzers showcased at the 2014 Pittcon exhibition.

Industry preferred particle size, particle shape, and zeta potential analyzers will be showcased by Microtrac, the global pioneer of particle characterization solutions at the 2014 Pittcon Exhibition.  The expo is being held at McCormick place, located in the Windy City (Chicago, IL) from March 3-6.

Pittcon is the preeminent exposition for the latest and greatest innovations in analytical lab instrumentation space, and will host attendees from all over the world.

Located at booth 3213, Microtrac will be showcasing the following particle analyzers.

Bluewave – The Bluewave is the first laser diffraction particle size analyzer to utilize blue lasers.  Because blue lasers have a shorter wavelength, users are able to measure particles down to 10 nanometers with unsurpassed accuracy and resolution.  Equipped with a Modified Mie Algorithm, users can confidently measure non-spherical particles, a task other mainstream particle analyzers struggle with.

Bluewave Si – Have you seen your agglomerates?  Now you can with the Bluewave Si.  Combining the Bluewave particle size analyzer, with a dynamic image analyzer, the Bluewave Si can provide simultaneous size and shape measurement capability for particles ranging in size from 5-1500 microns.

Nanotrac Wave – The Nanotrac Wave is a dynamic light scattering instrument that can measure particle size, zeta potential, and molecular weight of particles ranging in size from 0.8 to 6500 nanometers.  Powered by the patented Controlled Reference Method, users have the ability to measure particles below 20 nm with superior clarity, a task other mainstream DLS analyzers struggle with.  The Nanotrac Wave has a built in Peltier temperature control device, which allows users to understand how temperature effects the material being measured.  The Nanotrac Wave can also measure materials with a wide concentration range (0.01 to 40%), which alleviates potential dilution problems.

Nanotrac Wave Q – Nanotrac Wave technology adapted for a cuvette sample cell interface, the Nanotrac Wave Q is Microtrac’s newest analyzer.  The Nanotrac Wave Q is ideal for users who are looking for the ability to conduct fast nanoparticle measurements by quickly swapping out cuvettes filled with samples.  The Nanotrac Wave Q is also perfect for users who looking to keep their material  contamination free.

NANO-flex – Nanotrac Wave technology adapted for fast and easy in-situ measurements made possible by an external probe.  The NANO-flex can also be paired with the Stabino for comprehensive size and zeta potential measurement capability.

PartAn – Formally the DIA – With the ability to measure particles in 3D, the PartAn is the only analyzer on the market with that functionality.  The PartAn can measure 25 morphological parameters and is an ideal alternative to tedious sieve analysis.  When compared to sieve results, the PartAn delivers a more representative sample report in less time and without user intervention.  The PartAn can measure particles ranging in size from 20 microns to 35 millimeters and is also available with online capability.

Can’t make it to Pittcon?  No problem, please click here to arrange to send your material for complimentary analysis.

Looking forward to seeing you in Chicago.

Particle characterization analyzers for the material science community will be on display at the 2014 TMS expo

Posted on: February 17th, 2014 by Microtrac

Particle characterization analyzers for the material science community will be on display at the 2014 TMS expo.

Microtrac, the global pioneer of particle characterization solutions is proud to display the following instruments from our industry preferred product line at the 2014 TMS exhibition located in San Diego, California.

The 2014 TMS annual meeting is in its 28th year, and is one of the premier showcases for the latest products and services designed specifically for the material science markets.  With over 4,300 attendees from all around the world, the show runs from February 16th to February 20th.  This years TMS will be held in sunny San Diego, California at the San Diego Convention Center.

Located at booth 332, Microtrac will be displaying the following particle characterization instruments:

S3500 – The Microtrac S3500 is a laser diffraction particle size analyzer that can measure particles ranging in size from 0.02 to 2800 microns.  Engineered with a rugged design and patented fixed optics, the S3500 is ideal for the “toughest environments,” such as an oil rig or production line.  The S3500 utilizes a patented modified Mie calculation to accurately measure non-spherical particles with high repeatability.

Turbotrac – The Turbotrac works in conjunction with the Microtrac S3500 to deliver perfectly dispersed dry powder to the analyzer to help alleviate costly sample prep errors.

Nanotrac Wave – The Nanotrac Wave is a Dynamic Light Scattering particle size, zeta potential, and molecular weight analyzer.  Unlike mainstream PCS analyzers, the Nanotrac Wave utilizes a proprietary Controlled Reference Method, which provides a user with unsurpassed resolution when measuring particles under 20 nanometers.

Nanotrac Wave Q – The Nanotrac Wave Q is our latest DLS analyzer.  The Nanotrac Wave Q is equipped with the patented Nanotrac technology, but adapted for a cuvette sample cell interface.  The Nanotrac Wave Q is ideal for users who want to make fast particle size measurements and are also concerned with keeping their sample contamination free.

Can’t make it to TMS 2014?  No problem, please click here to contact us to arrange a complimentary analysis of your material.

Looking forward to seeing you in San Diego.

Particle Shape Analysis of Coal

Posted on: December 13th, 2013 by Microtrac

Particle Shape Analysis of Coal

As December 25th approaches, Jesse realizes there is still a lot of work to get done to complete the “secret project” on time.

Every year, thousand’s of children make Santa’s naughty or nice list.  The nice kids, well they receive their presents.  The bad kids on the other hand, they receive coal.  Lots and lots of coal.

Santa is a stand up guy.  Even though the children were “naughty,” this year, Santa still wants them to receive the best quality coal.

Santa has asked Jesse to measure the shape of the coal to make sure it’s perfectly round.  “Only the best shaped coal will be delivered to the ‘naughty’ kids,” said Santa. Santa feels the Microtrac PartAn (formally DIA), is the only instrument that can quickly measure the shape of the coal, and provide data in real time, which is a great function for quality control.   Santa is also a really big fan of the PartAn’s 3D technology, a feature exclusive to Microtrac.

Fast and easy Image Analysis makes Jesse’s job a lot easier

View the shape of the coal here

View a scatter diagram of the coal data

View the coal size data here

Now that Santa has the best quality coal for the “naughty” kids, Jesse can move onto the next part of the “secret project.”  Stay tuned to find out what that is.

Special thanks to Blaschak Coal, the official sponsor of Santa’s coal for the naughty.  

Contact Jesse 

Particle Analysis Instruments Showcased for the Material Science Community at the 2013 MRS Fall Meeting

Posted on: November 27th, 2013 by Microtrac

Particle Analysis Instruments Showcased for the Material Science Community at the 2013 MRS Fall Meeting.

Microtrac, the global pioneer of particle characterization will be showcasing key products from their industry preferred product line to the material science community at the 2013 MRS Fall Meeting and Exhibit taking place at the Hynes Convention Center located in Boston, Massachusetts from December 3rd through December 5th.

The Materials Research Societies Fall Meeting and Exhibit features over 50 symposia and is attended by over 6,000 material science professionals from all over the world.

Located at booth 720 Microtrac will be showcasing the following instruments:

Stabino – The Stabino is a particle charge analyzer equipped with a built in titrator that allows a user to complete forward titrations in 5 minutes.  The Stabino has the ability to measure the zeta potential of samples ranging in size from 0.3 nanometers to 600 microns and can also measure highly concentrated materials (up to 70% without dilution).  Because of the design of the Stabino, bubbles have no effect on the outcome of the measurement.  If you are looking for particle size and zeta potential, the Stabino pairs nicely with the NANO-flex.

Nanotrac Wave – the Nanotrac Wave is a Dynamic Light Scattering instrument that can measure particle size, zeta potential, and molecular weight in one bench top unit.  The Nanotrac Wave can measure particles ranging in size from 0.8 to 6500 nanometers.  Equipped with the patented Controlled Reference Method, the Nanotrac Wave has the ability to accurately measure particles under 20 nanometers, a feat other DLS analyzers struggle to achieve.

Nanotrac Flex – The NANO-flex is a Dynamic Light Scattering particle size analyzer that can measure particles ranging in size from 0.8 to 6500 nanometers.  What makes the NANO-flex unique is the probe technology that allows a user to analyze in-situ, or simply “dip and measure.”  If you would like to measure zeta potential, the NANO-flex pairs nicely with the Stabino.

Bluewave – the Bluewave is a Laser Diffraction particle size analyzer that can measure wet or dry particles ranging in size from 0.01 to 2000 microns.  What sets the Bluewave apart from other Laser Diffraction particle analyzers is the ability to accurately size particles under 1 micron by utilizing blue laser diodes (not LED’s).  The Bluewave also uses a proprietary modified mie calculation that enables the analyzer to accurately characterize non-spherical particles.

SI – The SI combines Dynamic Image Analysis with Laser Diffraction to provide users with a comprehensive measurement.  With the ability to measure particle size, users also have the additional capability of being able to analyze 24 morphological parameters of their material.  By having size and shape information readily available, users can gain a better understanding of what size and shape factors impact quality.

Can’t attend MRS but would like to learn more about Microtrac’s instruments? Please click here to arrange to send samples or schedule a consultation with a technical specialist.

Looking forward to seeing you in Boston!


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