Improve the efficiency of your nanoparticle measurements with Microtrac’s innovative suite of particle characterization solutions.
Microtrac, the global pioneer of particle characterization solutions will be showcasing an innovative suite of nanoparticle analyzers at the Nanotech 2014 exhibition from June 16-17. The event is being held at the Gaylord Convention Center, located in the National Harbor, in picturesque Prince George County Maryland.
Nanotech 2014 is the premier global nanotechnology conference for research and development professionals to learn about the latest technological advancements. The exhibition is also a great opportunity to network and share ideas with other nanotechnology professionals from around the world.
Located at booth 106, Microtrac will be showcasing the following particle analysis instrumentation.
Nanotrac Wave – The Nanotrac Wave is a dynamic light scattering particle size analyzer that is ideal for nanoparticle multimodal distributions. The Wave utilizes a patented enhanced optical signal, which provides users with superior accuracy and resolution when measuring multimodal distributions under 100 nanometers. The Nanotrac Wave can measure particles ranging in size from 0.8 to 6500 nanometers. The Nanotrac Wave can also measure Zeta Potential and Molecular Weight, making this instrument a versatile addition to your laboratory.
Nanotrac Wave Q – The Wave Q has all the main features of the Nanotrac Wave but adapted with a cuvette interface. The Wave Q is ideal for users who are worried about cross contamination of their sample or looking to perform a high volume of measurements in a short amount of time. Unique to Microtrac, the Wave Q features a software alert that notifies the user if there is a problem with the cuvette orientation, which greatly reduces misleading results due to cuvette “hiccups.”
Nanotrac Flex – The Nanotrac Flex is a dynamic light scattering analyzer that is ideal for in-situ particle size measurements. The NANO-flex can measure particles ranging in size from 0.8 to 6500 nanometers. The NANO-flex features a probe tip/detector system, that allows a user to simply “dip and measure.” The NANO-flex can also be used for online process control.
Can’t make it to DC for the show? No problem, please click here to contact Microtrac to arrange an onsite or virtual demo.
We look forward to seeing you in DC!