Search

Particle Size & Shape Analysis with Microtrac's optical particle analyzers

For the physical characterization of particles Microtrac offers a range of optical particle analyzers. Microtrac is the only worldwide supplier of dynamic image analysis, static image analysis, laser diffraction and sieve analysis equipment with an extensive understanding of the strengths and weaknesses of each method.

Sieve Analysis, Laser Diffraction or Dynamic Image Analysis? Comparison of measurement techniques

 

Dynamic Image
Analysis (DIA)
Static Image
Analysis
Sieve Analysis
(Retsch)
Laser Diffraction Dynamic Light
Scattering (DLS)
Wide dynamic measurement range
Reproducibility and repeatability
High resolution for narrow distributions
Particle shape analysis
Direct measurement technique
Reliable detection of oversized grains
Robust hardware,
easy operation for routine analysis
Analysis of individual particles
High measurement speed,
short measurement times
Analysis of nano particles
Analysis of Zeta potential
and molecular weight
Versatility
Measuring range 0.8 µm - 135 mm 0.5 µm – 1.5 mm 10 µm - 125 mm 10 nm – 5 mm 0.8 nm - 6500 nm