Webinar: More Than Particle Size: Discover the Power of the Camera
Online webinář | Jazyk : Anglicky
Particle size distributions provide valuable information, but they don't always tell the full story. Oversized particles, agglomerates, and differences in particle shape can be difficult to identify using laser diffraction alone. Dynamic image analysis adds a new perspective by making individual particles visible.
In this webinar, discover how combining laser diffraction (LD) and dynamic image analysis (DIA) provides deeper insights into particle characteristics. Using practical examples from different industries, we will demonstrate how camera-based analysis complements conventional particle size measurement.
The Microtrac SYNC series integrates laser diffraction and dynamic image analysis into a single measurement system. With a shared sample flow path and software platform, it combines the speed and wide measurement range of laser diffraction with detailed particle imaging.
Topics include:
- Oversized particles: Detect coarse particles and understand their impact on product quality.
- Agglomeration detection: Use particle images to identify agglomerates and better understand dispersion quality.
- Particle shape analysis: Explore how imaging reveals differences in particle morphology, including examples from metal powders.
- Combining LD and DIA: Discover how the BLEND algorithm brings together the strengths of both measurement techniques.
- Dry dispersion: See how laser diffraction and dynamic image analysis complement each other in practical applications.
Who should attend?
- Quality control and quality assurance professionals
- Researchers and scientists working with particle characterization
- Laboratory specialists in industries such as pharmaceuticals, food, coatings, and metal powders
- Professionals interested in particle size, shape, and dispersion analysis
Why attend?
- Go beyond particle size distributions and discover how imaging can help you identify hidden particle characteristics, better understand your samples, and interpret measurement results with greater confidence.
Your Registration
Date: Tuesday, November 10, 2026
Two sessions:
10:00 – 10:45 AM (CET)
04:00 – 04:45 PM (CET)
Language: English
Two sessions:
10:00 – 10:45 AM (CET)
04:00 – 04:45 PM (CET)
Language: English